journal article·2024-04-29

An Efficient Electron Ptychography Method for Retrieving the Object Spectrum from Only a Few Iterations

Zhongbo Li, Johannes Biskupek, Martin Linck, Harald Rose, Pirmin Kükelhan, Heiko Müller, Ute Kaiser

Microscopy and Microanalysis· Volume 30· Issue 2
Publisher page

Abstract

Abstract We present an efficient approach for electron ptychography based on a mathematical relationship that differs from that underlying the established algorithms of the ptychography iterative engine or the noniterative algorithms like the Wigner-distribution-deconvolution or the single-side-band method. Three variables are handled in this method—the transfer function of the objective lens, the object spectrum, and the diffraction wave whose phase is unknown. In the case of an aberration-corrected electron microscope, one is able to obtain a well-estimated transfer function of the lens. After reducing the number of three variables down to two, we construct an iterative loop between the object spectrum and the diffraction wave, which retrieves the object spectrum within a small number of iterations. We tested this object spectrum retrieval method on both a calculated and an experimental 4D-STEM datasets. By applying this method, we explore the influence of sampling, dose, and the size of illumination aperture on the reconstructed phase images.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Advanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Crystallography and Radiation Phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Electron Microscopy Group of Materials Science, University of Ulm , Ulm 89081 , Germany

Corrected Electron Optical Systems Gmbh , Heidelberg 69126 , Germany

References (32)

Show source-provided references
1. Electron ptychography achieves atomic-resolution limits set by lattice vibrations10.1126/science.abg2533 ↗
2. Deterministic electron ptychography at atomic resolution10.1103/PhysRevB.89.064101 ↗
3. De Graef · 200310.1017/CBO9780511615092 ↗
4. Material-specific high-resolution table-top extreme ultraviolet microscopy10.1038/s41377-022-00797-6 ↗
5. Present and future hexapole aberration correctors for high-resolution electron microscopy10.1016/S1076-5670(08)01002-1 ↗
6. Electron microscopy image enhanced10.1038/33823 ↗
7. Dynamische theorie der Kristallstrukturanalyse durch Elektronenbeugung im inhomogenen Primärstrahlwellenfeld10.1002/bbpc.19700741112 ↗
8. Trace structure analysis, ptychography, phase tomography10.1016/0304-3991(82)90038-9 ↗
9. High-resolution chemical imaging of gold nanoparticles using hard x-ray ptychography10.1063/1.4807020 ↗
10. Electron ptychography of 2D materials to deep sub-ångström resolution10.1038/s41586-018-0298-5 ↗
11. Kahl · 2019
12. Kirkland · 199810.1007/978-1-4757-4406-4 ↗
13. Prospects of annular differential phase contrast applied for optical sectioning in STEM10.1016/j.ultramic.2018.09.012 ↗
14. Electron dose dependence of signal-to-noise ratio, atom contrast and resolution in transmission electron microscope images10.1016/j.ultramic.2014.01.010 ↗
15. Computationally efficient handling of partially coherent electron sources in (S)TEM image simulations via matrix diagonalization10.1017/S1431927622012387 ↗
16. Ptychographic transmission microscopy in three dimensions using a multi-slice approach10.1364/JOSAA.29.001606 ↗
17. An improved ptychographical phase retrieval algorithm for diffractive imaging10.1016/j.ultramic.2009.05.012 ↗
18. Sharp: A distributed gpu-based ptychographic solver10.1107/S1600576716008074 ↗
19. Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution10.1016/j.ultramic.2014.09.013 ↗
20. Hybrid pixel direct detector for electron energy loss spectroscopy10.1016/j.ultramic.2020.113067 ↗
21. Atom-scale ptychographic electron diffractive imaging of boron nitride cones10.1103/PhysRevLett.108.073901 ↗
22. Reimer · 2008
23. The theory of super-resolution electron microscopy via Wigner-distribution deconvolution10.1098/rsta.1992.0050 ↗
24. A phase retrieval algorithm for shifting illumination10.1063/1.1823034 ↗
25. Transmission microscopy without lenses for objects of unlimited size10.1016/j.ultramic.2006.07.007 ↗
26. Rodenburg · 2019 · 81910.1007/978-3-030-00069-1_17 ↗
27. Relaxed averaged alternating reflections for diffraction imaging10.1088/0266-5611/21/1/004 ↗
28. High dynamic range pixel array detector for scanning transmission electron microscopy10.1017/S1431927615015664 ↗
29. Probe retrieval in ptychographic coherent diffractive imaging10.1016/j.ultramic.2008.12.011 ↗
30. X-ray ptychography with extended depth of field10.1364/OE.24.029089 ↗
31. Residual wave aberrations in the first spherical aberration corrected transmission electron microscope10.1016/S0304-3991(97)00102-2 ↗
32. Zwei Bemerkungen über die Zerstreuung korpuskularer Strahlen als Beugungserscheinung10.1007/BF01390457 ↗