Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope

Journal Article Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope Get access Masashi Watanabe, Masashi Watanabe Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, United States Search for other works by this author on: Oxford Academic Google Scholar Giulio Guzzinati, Giulio Guzzinati CEOS GmbH, Heidelberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Pirmin Kükelhan, Pirmin Kükelhan CEOS GmbH, Heidelberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Volker Gerheim, Volker Gerheim CEOS GmbH, Heidelberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Martin Linck, Martin Linck CEOS GmbH, Heidelberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Heiko Müller, Heiko Müller CEOS GmbH, Heidelberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Max Haider, Max Haider CEOS GmbH, Heidelberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Thomas F Hoffman, Thomas F Hoffman JEOL USA, Peabody, MA, United States Search for other works by this author on: Oxford Academic Google Scholar Thomas Isabell, Thomas Isabell JEOL USA, Peabody, MA, United States Search for other works by this author on: Oxford Academic Google Scholar Naoki Shimura, Naoki Shimura JEOL USA, Peabody, MA, United States Search for other works by this author on: Oxford Academic Google Scholar ... Show more Hidetaka Sawada Hidetaka Sawada JEOL USA, Peabody, MA, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 416–417, https://doi.org/10.1093/micmic/ozad067.196 Published: 22 July 2023