Detection Limits for Imaging Chiral Magnetic Materials with 4-Dimensional Lorentz Scanning Transmission Electron Microscopy
Source abstract
Abstract
Xiyue S Zhang, Kayla X Nguyen, Emrah Turgut, Zhen Chen, Celesta S Chang, Yu-Tsun Shao, Gregory D Fuchs, David A Muller; Detection Limits for Imaging Chiral
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Magnetic properties of thin films · Surface and Thin Film Phenomena · Advanced Electron Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Cornell University School of Applied and Engineering Physics, , Ithaca, NY, USA
University of Illinois Urbana-Champaign Department of Materials Science and Engineering, , Urbana, IL, USA
Taiwan Semiconductor Manufacturing Company , San Jose, CA, USA
Kavli Institute at Cornell for Nanoscale Science , Ithaca, NY, USA
References (7)
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