Mapping pm-scale Lattice Distortions and Measuring Interlayer Separations in Stacked 2D Materials by Interferometric 4D-STEM
Source abstract
Abstract
Michael J Zachman, Jacob Madsen, Xiang Zhang, Pulickel Ajayan, Toma Susi, Miaofang Chi; Mapping pm-scale Lattice Distortions and Measuring Interlayer Separ
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: 2D Materials and Applications · Ga2O3 and related materials · Graphene research and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Center for Nanophase Materials Sciences , Oak Ridge National Laboratory, Oak Ridge, TN, USA
University of Vienna Faculty of Physics, , Vienna, Austria
Rice University Department of Materials Science and NanoEngineering, , Houston, TX, USA
References (11)
Show source-provided references
1. Novoselov · Science · 2016 · 35310.1126/science.aac9439 ↗
2. Yoo · Nat. Mater · 2019 · 1810.1038/s41563-019-0346-z ↗
3. Cao · Nature · 2018 · 556
4. Cao · Nature · 2018 · 556
5. Sung · Phys. Rev. Mater · 2019 · 3
6. Brown · Nano Lett · 2012 · 1210.1021/nl204547v ↗
7. Alden · Proc. Nat. Acad. Sci · 2013 · 11010.1073/pnas.1309394110 ↗
8. Kim · ACS Nano · 2017 · 11
9. Argentero · Nano Lett · 2017 · 1710.1021/acs.nanolett.6b04360 ↗
10. Kazmierczak · Nat. Mater · 2021 · 2010.1038/s41563-021-00973-w ↗
11. Zachman · Small · 2021 · 17