Yield Assessment of Protective Coatings for Atom Probe Analysis
Source abstract
Abstract
Journal Article Yield Assessment of Protective Coatings for Atom Probe Analysis Get access Yimeng Chen, Yimeng Chen CAMECA Instruments Inc., Madison, WI USA Corresponding author: Yimeng.Chen@ametek.com Search for other works by this author on: Oxford Academic Google Scholar Katherine P Rice, Katherine P Rice CAMECA Instruments Inc., Madison, WI USA Search for other works by this author on: Oxford Academic Google Scholar Robert M Ulfig Robert M Ulfig CAMECA Instruments Inc., Madison, WI USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 72–73, https://doi.org/10.1017/S1431927622001192 Published: 01 August 2022
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Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Hydrogen embrittlement and corrosion behaviors in metals · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
CAMECA Instruments Inc. , Madison, WI USA
References (3)
Show source-provided references
1. Prosa · Microsc. Microanal · 2017 · 23 · 19410.1017/S1431927616012642 ↗
2. Larson · Ultramicroscopy · 2015 · 159 · 42010.1016/j.ultramic.2015.02.014 ↗
3. Thompson · Microsc. Microanal · 2005 · 11 · 882