Fundamental aspects of SXES in the Quantification of Minerals and Materials
Source abstract
Abstract
Nicholas Wilson, Colin MacRae, Aaron Torpy; Fundamental aspects of SXES in the Quantification of Minerals and Materials, Microscopy and Microanalysis, Volu
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Radioactive element chemistry and processing
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References (3)
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1. Quantitative Measurement of Iron-Silicides by EPMA Using the Fe Lα and Lβ X-ray Lines: A New Twist to an Old Approach10.1017/S1431927619000436 ↗
2. 2. Takahashi, H , McSwiggen, P , Nelson, C. A Unique Wavelength-dispersive Soft X-ray Emission spectrometer for electron probe x-ray microanalysers. Microscopy and Analysis. 2014.
3. 1. Takahashi, H. Characteristic Features and Applications of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe X-ray Microanalyzers and Scanning Electron Microscopes. JEOL News. 2014.