journal article·2021-08Open access

STEM-in-SEM Imaging and Diffraction with Extremely Beam Sensitive Ultrathin Zeolites

Jason Holm

Microscopy and Microanalysis· Volume 27· Issue S1

Abstract

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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Zeolite Catalysis and Synthesis

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References (5)

Show source-provided references
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2. Kumar · Nature Materials · 2020 · 19 · 449
3. [5] Trade names and company products identified in the text do not imply recommendation or endorsement by NIST, nor do they imply that the products are best suited for the purpose.
4. Jeon · Nature · 2017 · 543 · 69010.1038/nature21421 ↗
5. Ugurlu · Phys. Rev. B · 2011 · 83 · 11340810.1103/PhysRevB.83.113408 ↗