Mitigating Shadowing and Topographic Artifacts Using Dual EDS Detectors
Source abstract
Abstract
Shangshang Mu, Jens Rafaelsen; Mitigating Shadowing and Topographic Artifacts Using Dual EDS Detectors, Microscopy and Microanalysis, Volume 27, Issue S1,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Non-Destructive Testing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (1)
Show source-provided references
1. The Influence of Surface Topography on the X-ray Intensity in Electron Microprobe Analysis (EDS/WDS)10.1002/sca.4950090205 ↗