Electron Microscopy and Interface Plasmons Characterization of Cadmium Telluride Thin Film Grown Incommensurately with Weak Bonding on Sapphire
Source abstract
Abstract
Hesham El-Sherif, Stephen Jovanovic, John Preston, Nabil Basim; Electron Microscopy and Interface Plasmons Characterization of Cadmium Telluride Thin Film
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films · 2D Materials and Applications
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References (3)
Show source-provided references
1. 10.1088/2053-1591/aaf26410.1088/2053-1591/aaf264 ↗
2. 10.1038/nature2205310.1038/nature22053 ↗
3. 10.1021/acs.nanolett.7b0273710.1021/acs.nanolett.7b02737 ↗