Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)
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Abstract
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Research context
OpenAlex topics: Electrochemical Analysis and Applications · Force Microscopy Techniques and Applications · Analytical Chemistry and Sensors
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References (4)
Show source-provided references
1. 10.1063/1.9299910.1063/1.92999 ↗
2. 10.1126/science.246485110.1126/science.2464851 ↗
3. 10.1039/C6FD00133E10.1039/C6FD00133E ↗
4. 10.1039/C5RA20291D10.1039/C5RA20291D ↗