Initiation of Grain Growth Observed Using Electrostatic-Subframing
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Abstract
Journal Article Initiation of Grain Growth Observed Using Electrostatic-Subframing Get access BW Reed, BW Reed Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA Search for other works by this author on: Oxford Academic Google Scholar AM Monterrosa, AM Monterrosa Sandia National Laboratories, Albuquerque, NM 87123, USA Search for other works by this author on: Oxford Academic Google Scholar AA Moghadam, AA Moghadam Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA Search for other works by this author on: Oxford Academic Google Scholar RS Bloom, RS Bloom Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA Search for other works by this author on: Oxford Academic Google Scholar ST Park, ST Park Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA Search for other works by this author on: Oxford Academic Google Scholar SA Briggs, SA Briggs Sandia National Laboratories, Albuquerque, NM 87123, USAOregon State University, Corvallis, OR 97331, USA Search for other works by this author on: Oxford Academic Google Scholar PM Price, PM Price Sandia National Laboratories, Albuquerque, NM 87123, USA Search for other works by this author on: Oxford Academic Google Scholar CM Barr, CM Barr Sandia National Laboratories, Albuquerque, NM 87123, USA Search for other works by this author on: Oxford Academic Google Scholar JT McKeown, JT McKeown Lawrence Livermore National Laboratory, Livermore, CA 94551, USA Search for other works by this author on: Oxford Academic Google Scholar DJ Masiel, DJ Masiel Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA 94588, USA Search for other works by this author on: Oxford Academic Google Scholar ... Show more K Hattar K Hattar Sandia National Laboratories, Albuquerque, NM 87123, USA Corresponding author: khattar@sandia.gov Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1518–1519, https://doi.org/10.1017/S1431927619008328 Published: 01 August 2019
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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques
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References (6)
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1. This work was supported by the US Department of Energy, Office of Basic Energy Sciences. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA-0003525. This material is based in part upon work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Award Number DE-SC0013104. SAND2019-1650 C
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