DataVXMicroscopy and MicroanalysisPaper
journal article·2017-07

Atom Probe Tomography and analytical Scanning Transmission Electron Microscopy of Rapid Solidification Microstructures in Al-Cu Alloy Thin Films

Jorg M.K. Wiezorek, Kai W. Zweiacker, Can Liu, Isabelle Martin, Ty. J. Prosa, David J. Larson

Microscopy and Microanalysis· Volume 23· Issue S1
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Abstract

Jorg MK Wiezorek, Kai W Zweiacker, Can Liu, Isabelle Martin, Ty J Prosa, David J Larson; Atom Probe Tomography and analytical Scanning Transmission Electro
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

Metals & alloys

OpenAlex topics: Advanced Materials Characterization Techniques · Solidification and crystal growth phenomena · Aluminum Alloy Microstructure Properties

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References (8)

Show source-provided references
1. 10.1016/j.actamat.2013.11.04610.1016/j.actamat.2013.11.046 ↗
2. 10.1063/1.192578410.1063/1.1925784 ↗
3. 10.1007/s11837-015-1793-x10.1007/s11837-015-1793-x ↗
4. 10.1016/0921-5093(94)90538-X10.1016/0921-5093(94)90538-X ↗
5. The authors acknowledge funding from the National Science Foundation, Grants NSF-1105757 and NSF-1607922.
6. 10.1007/978-1-4614-8721-010.1007/978-1-4614-8721-0 ↗
7. 10.1016/0956-7151(92)90454-M10.1016/0956-7151(92)90454-M ↗
8. 10.1016/0956-7151(93)90237-M10.1016/0956-7151(93)90237-M ↗