SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions
Source abstract
Abstract
Raphaelle Dianoux, Adi Scheidemann, Ewald Niehuis, Rudolf Mollers, Felix Kollmer, Henrik Arlinghaus, Hans-Josef Hug, Laetitia Bernard, Sasa Vranjkovic; SFM
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Integrated Circuits and Semiconductor Failure Analysis · Force Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1038/nature0553010.1038/nature05530 ↗
2. 10.1002/sia.509310.1002/sia.5093 ↗
3. 10.1038/nphoton.2010.9010.1038/nphoton.2010.90 ↗