journal article·2015-08Open access

Application of Bremsstrahlung Background Calculation and Automated Element Identification to TEM EDS Spectra

F. Eggert, P.P. Camus, A. Sandborg, N.J. Zaluzec

Microscopy and Microanalysis· Volume 21· Issue S3

Abstract

F Eggert, PP Camus, A Sandborg, NJ Zaluzec; Application of Bremsstrahlung Background Calculation and Automated Element Identification to TEM EDS Spectra, M
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Non-Destructive Testing Techniques · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis

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References (3)

Show source-provided references
1. Experim.Techn.d.Physik · 1985 · 33 · 441
2. IOP Conf. Ser.: Mater. Sci. Eng · 2010 · 012007
3. Proc.9.Ann.Conf.Microbeam Analysis Soc · 1974 · 53