X-ray Mapping Characterisation of Materials that have a Large Dynamic Compositional Range
Source abstract
Abstract
Richard Wuhrer, Ken Moran; X-ray Mapping Characterisation of Materials that have a Large Dynamic Compositional Range, Microscopy and Microanalysis, Volume
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Diffraction in Crystallography · X-ray Spectroscopy and Fluorescence Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1007/s00604-006-0507-z10.1007/s00604-006-0507-z ↗
2. IOP Conference Series: Materials Science and Engineering Volume · 2014 · 55
3. Microsc. Microanal · 2006 · 12 · 2