Transmission-EBSD Using High Current Electron Beams
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Abstract
Journal Article Transmission-EBSD Using High Current Electron Beams Get access Majid Abbasi, Majid Abbasi High Temperature Energy Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, Republic of Korea majid.abbasi@kist.re.kr, Phone: (+82) 10-8946-8873 Fax: (+82) 2-958-5449 Search for other works by this author on: Oxford Academic Google Scholar Dong-Ik Kim, Dong-Ik Kim High Temperature Energy Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, Republic of Korea Search for other works by this author on: Oxford Academic Google Scholar Hwan-Uk Guim, Hwan-Uk Guim Nano-Bio Electron Microscopy Research Team, Korea Basic Science Institute (KBSI), Daejeon 305-333, Republic of Korea Search for other works by this author on: Oxford Academic Google Scholar Woo-Sang Jung Woo-Sang Jung High Temperature Energy Materials Research Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, Republic of Korea Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 1652–1653, https://doi.org/10.1017/S1431927616009107 Published: 25 July 2016
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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis · Advanced Electron Microscopy Techniques and Applications
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References (9)
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