DataVXMicroscopy and MicroanalysisPaper
journal article·2016-07

Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV

Martin Linck, Peter Hartel, Stephan Uhlemann, Frank Kahl, Heiko Müller, Joachim Zach, Johannes Biskupek, Marcel Niestadt, Ute Kaiser, Max Haider

Microscopy and Microanalysis· Volume 22· Issue S3
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Abstract

Martin Linck, Peter Hartel, Stephan Uhlemann, Frank Kahl, Heiko Müller, Joachim Zach, Johannes Biskupek, Marcel Niestadt, Ute Kaiser, Max Haider; Performan
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis

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References (3)

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1. Proc. 10th Eur. Congr. El. Micr. (Granada, Spain) · 1992 · 47
2. 10.1103/PhysRevLett.111.04610110.1103/PhysRevLett.111.046101 ↗
3. 10.1016/j.ultramic.2011.03.01210.1016/j.ultramic.2011.03.012 ↗