journal article·2013-08

Movie Mode Dynamic Transmission Electron Microscope: Revealing Material Processes at Nanometer and Nanosecond Scales with Multi-frame Acquisition

T. LaGrange, B.W. Reed, J.T. McKeown, M.K. Santala, W.J. Dehope, G. Huete, R.M. Shuttlesworth, G.H. Campbell

Microscopy and Microanalysis· Volume 19· Issue S2
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis

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References

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