Use of Secondary Ions Mass Spectrometry (SIMS) for Cladding Materials Post-Irradiation Examination (PIE)
Source abstract
Abstract
S Portier, N Mine, M Martin; Use of Secondary Ions Mass Spectrometry (SIMS) for Cladding Materials Post-Irradiation Examination (PIE), Microscopy and Micro
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis
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References
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