Atom-by-Atom STEM Investigation of Defect Engineering in Graphene
Source abstract
Abstract
QM Ramasse, DM Kepapstoglou, FS Hage, T Susi, J Kotakoski, C Mangler, P Ayala, J Meyer, JA Hinks, S Donnelly, R Zan, CT Pan, SJ Haigh, U Bangert; Atom-by-A
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Graphene research and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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