DataVXMicroscopy and MicroanalysisPaper
journal article·2010-07

SEM, EDS and CL Investigations of ZnMnO and ZnCoO Layers Grown at Low Temperature by Atomic Layer Deposition

M Godlewski, B Witkowski, B Kowalski, M Łukasiewicz, R Jakieła, E Guziewicz

Microscopy and Microanalysis· Volume 16· Issue S2
Publisher page
Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

Materials processing

OpenAlex topics: ZnO doping and properties · Electron and X-Ray Spectroscopy Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References

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