Nanoanalysis in SEM and STEM: EDS Using Silicon Drift Detectors in Comparison to EELS Using Cs-Corrected STEM
Source abstract
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
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References
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