journal article·2022-08-01Open access

Use of Partial Scattering EDX Cross-Sections to Quantify Light Elements in the STEM

AA Sheader, PD Nellist

Microscopy and Microanalysis· Volume 28· Issue S1

Abstract

Energy dispersive X-ray spectroscopy (EDX) is a versatile tool within the scanning transmission electron microscope (STEM). Qualitative chemical maps may be obtained with good spatial resolution and relatively little effort for many samples, in contrast with the more labour-intensive data processing required to produce elemental maps using e.g. electron energy loss spectroscopy (EELS).
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Advanced Electron Microscopy Techniques and Applications

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Affiliations

University of Oxford , Department of Materials, Oxford, United Kingdom

References (6)

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