Accurately measuring ice thickness quickly and quantitatively on a screening TEM
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Abstract
Hamish Brown, Eric Hanssen; Accurately measuring ice thickness quickly and quantitatively on a screening TEM, Microscopy and Microanalysis, Volume 27, Issu
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · RNA Research and Splicing · Icing and De-icing Technologies
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References (8)
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1. [8] We acknowledge use of the ThermoFischer Arctica and Tecnai F30 microscopes at the Ian Holmes Imaging centre, Bio21 Institute at the University of Melbourne
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