journal article·2021-08Open access

Denoising STEM Electron Energy Loss Spectra using Convolutional Autoencoders

Mark Oxley, Maxim Ziatdinov, Sergei Kalinin

Microscopy and Microanalysis· Volume 27· Issue S1

Abstract

Mark Oxley, Maxim Ziatdinov, Sergei Kalinin; Denoising STEM Electron Energy Loss Spectra using Convolutional Autoencoders, Microscopy and Microanalysis, Vo
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Machine Learning in Materials Science · Advanced Electron Microscopy Techniques and Applications

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References (3)

Show source-provided references
1. Bonnet · Journal of Microscopy · 1998 · 19010.1046/j.1365-2818.1998.3250876.x ↗
2. ;
3. [3] This effort (ML and STEM) is based upon work supported by the U.S. Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES), Materials Sciences and Engineering Division (M.P.O., S.V.K.) and was performed and partially supported (M.Z.) at the Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy, Office of Science User Facility.