Auger Electron Spectroscopy (AES): A Versatile Microanalysis Technique in the Analyst's Toolbox
Source abstract
Abstract
Journal Article Auger Electron Spectroscopy (AES): A Versatile Microanalysis Technique in the Analyst's Toolbox Get access Juergen Scherer Juergen Scherer EAG Laboratories, Chanhassen, Minnesota, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 1564–1565, https://doi.org/10.1017/S143192762001853X Published: 01 August 2020
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. [1] Briggs, D. and Seah, M.P. in Practical Surface Analysis, Volume 1, John Wiley & Sons, ISBN 0-471-92081-9
2. Watson · Journal of Surface Analysis · 1999 · 5 · 64
3. 10.1002/(SICI)1096-9918(199811)26:12<908::AID-SIA438>3.0.CO;2-H10.1002/(SICI)1096-9918(199811)26:12<908::AID-SIA438>3.0.CO;2-H ↗
4. 10.1116/1.58002710.1116/1.580027 ↗
5. [4] Childs, K. , Carlson, B. , LaVanier, L. , Moulder, J. , Paul, D. , Stickle, W. , Watson, D. , Handbook of Auger Electron Spectroscopy, ISBN 0-9648124-0-1