Measuring the Thickness of 2D Materials Using EDS

Samuel Marks; Philippe Pinard; Simon Burgess; Jo Bithell; Richard Beanland

doi:10.1017/s1431927620017353

journal article·2020-08Open access

Measuring the Thickness of 2D Materials Using EDS

Samuel Marks, Philippe Pinard, Simon Burgess, Jo Bithell, Richard Beanland

Microscopy and Microanalysis· Volume 26· Issue S2

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Abstract

Samuel Marks, Philippe Pinard, Simon Burgess, Jo Bithell, Richard Beanland; Measuring the Thickness of 2D Materials Using EDS, Microscopy and Microanalysis

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Source: openalex_inverted_index · Quality: short

Research context

Nanomaterials

OpenAlex topics: Graphene research and applications · Advancements in Battery Materials · ZnO doping and properties

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