High Resolution Imaging of Dislocations Using Weak Beam Dark Field STEM
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
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References (4)
Show source-provided references
1. Miao · Microscopy and Microanalysis · 2018 · 24
2. 10.1080/1478643690822821010.1080/14786436908228210 ↗
3. 10.1017/S143192761005450410.1017/S1431927610054504 ↗
4. [4] The author is grateful to Prof. M. De Graef (CMU) and Prof. M.J. Mills (OSU) for helpful discussions.