Quantifying the Protection Factor of Graphene Substrates for Atomic-scale Imaging of Organic Crystals
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Abstract
Blanka Janicek, Priti Kharel, Sang hyun Bae, Pinshane Huang; Quantifying the Protection Factor of Graphene Substrates for Atomic-scale Imaging of Organic C
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques
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References (6)
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1. [6] This work was supported by the Packard Foundation and an NSF CAREER award under DMR-1846206. The experimental work was carried out in the Materials Research Laboratory.
2. Reimer · Transmission Electron Microscopy: Physics of Image Formation · Springer · 474
3. 10.1016/j.micron.2019.01.00510.1016/j.micron.2019.01.005 ↗
4. 10.1063/1.483003610.1063/1.4830036 ↗
5. 10.1021/acs.nanolett.9b0243410.1021/acs.nanolett.9b02434 ↗
6. 10.3390/bios804009510.3390/bios8040095 ↗