The Potential Benefits of Compressed Sensing and Machine Learning for Advanced Imaging and Spectroscopy in the Electron Microscope
Source abstract
Abstract
Nigel Browning, Robert Klie, Anthony Barker, Andrew Stevens, Christopher Buurma; The Potential Benefits of Compressed Sensing and Machine Learning for Adva
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · CCD and CMOS Imaging Sensors · Advanced Fluorescence Microscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (6)
Show source-provided references
1. Controlling and Observing the Kinetics of Nucleation and Growth by Sub-Sampling Dynamic In-Situ STEM Images
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3. Sub-sampled STEM-Ptychography
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5. Sub-sampled Approaches for Extremely Low-Dose STEM
6. 10.1093/jmicro/dft04210.1093/jmicro/dft042 ↗