DataVXMicroscopy and MicroanalysisPaper
journal article·2019-08Open access

Mapping Non-Crystalline Nanostructure in Beam Sensitive Systems With Low-dose Scanning Electron Pair Distribution Function Analysis

Joonatan E. M. Laulainen, Duncan N. Johnstone, Ivan Bogachev, Sean M. Collins, Louis Longley, Thomas D. Bennett, Paul A. Midgley

Microscopy and Microanalysis· Volume 25· Issue S2
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Nanomaterials

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Ion-surface interactions and analysis

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References (6)

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2. 10.1126/science.113508010.1126/science.1135080 ↗
3. The authors acknowledge funding from the EPSRC (Grant no. EP/R008779/1) and through doctoral training award EP/R513180/1. We thank Diamond Light Source Ltd. for access and support in the use of the electron Physical Science Imaging Centre (EM16983, EM19130, EM20195, MG21979).
4. 10.1016/j.ultramic.2016.05.00910.1016/j.ultramic.2016.05.009 ↗
5. 10.1146/annurev.matsci.35.082803.10333710.1146/annurev.matsci.35.082803.103337 ↗
6. Cockayne · Acta Crystallographica Section A · 1988 · 44 · 87010.1107/S0108767388004957 ↗