Probing the Origin of Microcracks in Layered Oxide Cathodes via Electron Microscopy

Journal Article Probing the Origin of Microcracks in Layered Oxide Cathodes via Electron Microscopy Get access Xiaoming Liu, Xiaoming Liu Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN USA Corresponding author: liux1@ornl.gov Search for other works by this author on: Oxford Academic Google Scholar Xiaowen Zhan, Xiaowen Zhan Dept. of Chemical and Materials Engineering, University of Kentucky, Lexington, KY USA Search for other works by this author on: Oxford Academic Google Scholar Zachary D Hood, Zachary D Hood Dept. of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA USA Search for other works by this author on: Oxford Academic Google Scholar Miaofang Chi Miaofang Chi Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 2058–2059, https://doi.org/10.1017/S1431927619011024 Published: 01 August 2019