Electron Crystallography in the Age of Pixelated Detectors: From Crystalline/Amorphous Organic Structural Models and Phase Mapping of Beam Sensitive Materials

Journal Article Electron Crystallography in the Age of Pixelated Detectors: From Crystalline/Amorphous Organic Structural Models and Phase Mapping of Beam Sensitive Materials Get access S Nicolopoulos, S Nicolopoulos NanoMEGAS SPRL, Brussels, Belgium Corresponding author: info@nanomegas.com Search for other works by this author on: Oxford Academic Google Scholar A Gomez, A Gomez NanoMEGAS SPRL, Brussels, Belgium Search for other works by this author on: Oxford Academic Google Scholar PP Das PP Das NanoMEGAS SPRL, Brussels, Belgium Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1948–1949, https://doi.org/10.1017/S143192761901047X Published: 01 August 2019