Subsampled Acquisition to Increase Speed and Reduce Data Size for In Situ TEM
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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (5)
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1. 10.1063/1.501619210.1063/1.5016192 ↗
2. 10.1149/2.1451709jes10.1149/2.1451709jes ↗
3. 10.1016/j.ultramic.2016.08.00710.1016/j.ultramic.2016.08.007 ↗
4. 10.1016/j.jsb.2012.01.00810.1016/j.jsb.2012.01.008 ↗
5. 10.1021/acs.accounts.7b0006310.1021/acs.accounts.7b00063 ↗