Characterization of Materials Properties by EBSD, EDS and AFM
Source abstract
Abstract
J Goulden, P Pinard, A Gholinia, M Kocun, R Proksch; Characterization of Materials Properties by EBSD, EDS and AFM, Microscopy and Microanalysis, Volume 24
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Machine Learning in Materials Science · Metal and Thin Film Mechanics · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1063/1.481232310.1063/1.4812323 ↗
2. 10.1023/A:101797343259210.1023/A:1017973432592 ↗
3. 10.1144/SP409.210.1144/SP409.2 ↗