Plasma Focused Ion Beam Curtaining Artifact Correction by Fourier-Based Linear Opti-mization Model
Source abstract
Abstract
Christopher W Schankula, Christopher K Anand, Nabil D Bassim; Plasma Focused Ion Beam Curtaining Artifact Correction by Fourier-Based Linear Opti-mization
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Ion-surface interactions and analysis · Advanced Surface Polishing Techniques
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References (2)
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1. 10.1016/j.ultramic.2015.11.00110.1016/j.ultramic.2015.11.001 ↗
2. 10.1016/j.cviu.2016.12.00810.1016/j.cviu.2016.12.008 ↗