Scanning TEM EBIC Imaging of Resistive Memory Switching Processes
Source abstract
Abstract
B C Regan, Jared Lodico, William A Hubbard; Scanning TEM EBIC Imaging of Resistive Memory Switching Processes, Microscopy and Microanalysis, Volume 24, Iss
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Memory and Neural Computing · Ferroelectric and Negative Capacitance Devices · Semiconductor materials and devices
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References (3)
Show source-provided references
1. 10.1063/1.479169510.1063/1.4791695 ↗
2. 10.1063/1.493676310.1063/1.4936763 ↗
3. 10.1021/acs.nanolett.5b0090110.1021/acs.nanolett.5b00901 ↗