Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope

G.T. Martinez; T. J. Pennycook; T.C. Naginey; L. Jones; H. Yang; J.R. Yates; R.J. Nicholls; M. Huth; M. Simson; H. Soltau; L. Struder; Y. Kondo; R. Sagawa; P.D. Nellist

doi:10.1017/s1431927617002860

journal article·2017-07Open access

Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope

G.T. Martinez, T. J. Pennycook, T.C. Naginey, L. Jones, H. Yang, J.R. Yates, R.J. Nicholls, M. Huth, M. Simson, H. Soltau, L. Struder, Y. Kondo, R. Sagawa, P.D. Nellist

Microscopy and Microanalysis· Volume 23· Issue S1

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Abstract

GT Martinez, T J Pennycook, TC Naginey, L Jones, H Yang, JR Yates, RJ Nicholls, M Huth, M Simson, H Soltau, L Struder, Y Kondo, R Sagawa, PD Nellist; Towar

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OpenAlex topics: Semiconductor materials and devices · Surface and Thin Film Phenomena · Electronic and Structural Properties of Oxides

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References (8)

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6. The research leading to these results has received funding from the EPSRC (EP/M010708/1)..

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