TEM Specimen Preparation for In Situ Heating Experiments Using FIB
Source abstract
Abstract
Sriram Vijayan, Mark Aindow, Joerg R Jinschek, Stephan Kujawa, Jens Greiser; TEM Specimen Preparation for In Situ Heating Experiments Using FIB, Microscopy
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques
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References (4)
Show source-provided references
1. 10.1017/S143192761401347610.1017/S1431927614013476 ↗
2. This work was supported in part by a research grant from FEI Company under an FEI-UConn partnership agreement. The studies were performed in the UConn/FEI Center for Advanced Microscopy and Materials Analysis (CAMMA).
3. 10.1017/S143192761601185510.1017/S1431927616011855 ↗
4. Jungjohann · 17