journal article·2016-07Open access

Performance Evaluation of Dual Bruker XFlash6 | 100 EDS Detector Integrated in FEI Themis With Analytical Objective Pole Piece

Emrah Yücelen, Mikhail Ovsyanko, Dennis Cats, Marcel Niestadt, Michiel Oosting, Vincent Jongenelen, Heike Richter, Jeroen van Engelshoven, David Foord

Microscopy and Microanalysis· Volume 22· Issue S3

Abstract

Emrah Yücelen, Mikhail Ovsyanko, Dennis Cats, Marcel Niestadt, Michiel Oosting, Vincent Jongenelen, Heike Richter, Jeroen van Engelshoven, David Foord; Per
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced X-ray and CT Imaging · X-ray Spectroscopy and Fluorescence Analysis

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References (2)

Show source-provided references
1. 10.1016/0304-3991(94)90079-510.1016/0304-3991(94)90079-5 ↗
2. Microscopy Today · 2010 · 18 · 14