Fast Aberration Measurement in Multi-Dimensional STEM
Source abstract
Abstract
Andrew R Lupini, Miaofang Chi, Sergei V Kalinin, Albina Y Borisevich, Juan Carlos Idrobo, Stephen Jesse; Fast Aberration Measurement in Multi-Dimensional S
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Advanced X-ray Imaging Techniques · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (4)
Show source-provided references
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2. 10.1016/j.ultramic.2008.04.09510.1016/j.ultramic.2008.04.095 ↗
3. 10.1016/S0304-3991(99)00013-310.1016/S0304-3991(99)00013-3 ↗
4. 10.1016/j.ultramic.2014.09.01310.1016/j.ultramic.2014.09.013 ↗