Dopant and Interfacial Analysis of Epitaxial CdTe Using Atom Probe Tomography
Source abstract
Abstract
George L Burton, David R Diercks, Brian P Gorman; Dopant and Interfacial Analysis of Epitaxial CdTe Using Atom Probe Tomography, Microscopy and Microanalys
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Advanced Semiconductor Detectors and Materials · Chalcogenide Semiconductor Thin Films
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References (3)
Show source-provided references
1. Microscopy Today · 2008 · 16 · 42
2. 10.1002/pip.252510.1002/pip.2525 ↗
3. 10.1039/C3EE41981A10.1039/C3EE41981A ↗