Characterizing the Geometric Detection Efficiency of EDX Detectors
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Abstract
Journal Article Characterizing the Geometric Detection Efficiency of EDX Detectors Get access Frederick H Schamber Frederick H Schamber Retired: 5095 Cherry Drive, Murrysville, PA 15668, frederick.schamber@gmail.com Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1479–1480, https://doi.org/10.1017/S143192761500817X Published: 23 September 2015
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques · X-ray Spectroscopy and Fluorescence Analysis
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References (2)
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1. 10.1017/S143192760909583X10.1017/S143192760909583X ↗
2. Microscopy and Microanalysis · 2014 · 20 · 1318