Advanced Analytical Electron Microscopy: New Perspectives on Real Materials
Source abstract
Abstract
M G Burke, S J Haigh, J J H Lim, A Janssen; Advanced Analytical Electron Microscopy: New Perspectives on Real Materials, Microscopy and Microanalysis, Volu
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques
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