X-ray Microscopy: The Cornerstone for Correlative Characterization Methods in Materials Research and Life Science
Source abstract
Abstract
Arno P Merkle, Jeff Gelb, Alexander Orchowski, Jochen Fuchs; X-ray Microscopy: The Cornerstone for Correlative Characterization Methods in Materials Resear
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced X-ray Imaging Techniques · X-ray Spectroscopy and Fluorescence Analysis · Advanced Electron Microscopy Techniques and Applications
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References
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