Interfacial Atomic Number Contrast in Thick Samples
Source abstract
Abstract
Aniruddha Dutta, Helge Heinrich; Interfacial Atomic Number Contrast in Thick Samples, Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 2014, Pag
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Radioactive element chemistry and processing · Electron and X-Ray Spectroscopy Techniques
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