journal article·2015-08Open access

Aberration-corrected STEM of Highly Loaded Pti/NiO Single-atom Catalysts: Structural and Catalytic Stability

S. B. Duan, R. M. Wang, J. Y. Liu

Microscopy and Microanalysis· Volume 21· Issue S3

Abstract

S B Duan, R M Wang, J Y Liu; Aberration-corrected STEM of Highly Loaded Pti/NiO Single-atom Catalysts: Structural and Catalytic Stability, Microscopy and M
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Catalytic Processes in Materials Science · Electrocatalysts for Energy Conversion · Copper-based nanomaterials and applications

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References (3)

Show source-provided references
1. 10.1126/science.126052610.1126/science.1260526 ↗
2. 10.1038/nchem.109510.1038/nchem.1095 ↗
3. 10.1021/ja401847c10.1021/ja401847c ↗