Ex situ Lift Out of PFIB Prepared TEM Specimens
Source abstract
Abstract
Lucille A Giannuzzi, Noel S Smith; Ex situ Lift Out of PFIB Prepared TEM Specimens, Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 2014, Pages
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications
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References
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