journal article·2014-08Open access

The Use of Regularized Least Squares Minimization for the Deconvolution of SEM Images

Eric Lifshin, Siwei Lyu, Yudhishthir R. Kandel, Richard Moore

Microscopy and Microanalysis· Volume 20· Issue S3

Abstract

Eric Lifshin, Siwei Lyu, Yudhishthir R Kandel, Richard Moore; The Use of Regularized Least Squares Minimization for the Deconvolution of SEM Images, Micros
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis · Advanced Electron Microscopy Techniques and Applications

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References

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