Thickness-Dependent Beam Broadening in Transmission EBSD
Source abstract
Abstract
Katherine P Rice, Robert R Keller; Thickness-Dependent Beam Broadening in Transmission EBSD, Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 20
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Microstructure and mechanical properties
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References
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